Key topics include wavefront testing, interferometry, and imaging system evaluation, which are essential for ensuring optical systems meet design specifications and operational requirements. The Multi Application Test System (MATS) is an integrated platform for high-precision, high-throughput testing of optical devices, transceivers, and photonic components. Built with proven laboratory grade technology, it delivers stable, repeatable, and accurate measurements required in photonics. 3D Interconnect Designer provides a flexible modeling and optimization environment for any advanced interconnect structure, including chiplets, stacked die, packages, and PCBs. Emulate every part of your data center infrastructure. Use 25+ X-Series. Test and characterize modern optical components, including photonic integrated circuits (PICs) and silicon photonics, with unmatched speed, precision and accuracy. Clock Recovery CR600 60Gbaud Optical/Electrical Clock Data Recovery Unit The CR600 Optoelectronic Clock Recovery Unit supports both NRZ and PAM4, enabling. As the world's leading independent, third-party testing laboratory, we provide a full testing solution for optical component characterization. Using the swept wavelength test method, we collect wavelength measurement data and perform a full analysis to give you a complete picture of insertion loss.